HITACHI (히타치), JEOL (지올)
| 제조사 | HITACHI (히타치) |
| 제품명 | FE SEM (Scanning Electron Microscope) |
| 모델명 | SU8600 |
| 주요사항 | Resolution : 0.6nm@15kV, 0.7nm@1kV Magnification : x20 ~ x2,000,000 Electron source: Cold field emission source Accelerating voltage : 0.5kV ~ 30kV (Landing volt. 0.01 ~ 20kV) Sample size: D 150mm, H 27mm |
| 제조사 | HITACHI (히타치) |
| 제품명 | SEM (Scanning Electron Microscope) |
| 모델명 | SU3900 |
| 주요사항 | Resolution : SE: 3.0nm@30kV, 15.0nm@1kV, BSE: 4.0nm@30kV Magnification : x5 ~ x300,000 Electron source : Pre-centered cartridge W filament Accelerating voltage : 0.3kV ~ 30kV Sample size: D 300mm, H 130mm |
| 제조사 | HITACHI (히타치) |
| 제품명 | SEM (Scanning Electron Microscope) |
| 모델명 | FlexSEM1000Ⅱ |
| 주요사항 | Resolution : SE: 4.0nm@20kV, BSE: 5.0nm@20kV Magnification: x6 ~ x300,000 Electron source: Pre-centered cartridge W filament Accelerating voltage: 0.3kV ~ 20kV Sample size: D 80mm, H 40mm |
| 제조사 | JEOL (지올) |
| 제품명 | SEM (Scanning Electron Microscope) |
| 모델명 | JSM-IT200 Series |
| 주요사항 | Resolution High vacuum mode: 3.0 nm (30 kV), 8.0 nm (3 kV) 15.0 nm (1.0 kV) Direct magnification : ×5 to 300,000 (Print size of 128 mm × 96 mm) Accelerating voltage : 0.5 to 30 kV Maximum specimen size : 150 mm dia. × 48 mm (H) |
